By Krzysztof Iniewski
The publication will handle the-state-of-the-art in built-in circuit layout within the context of rising structures. New intriguing possibilities in physique zone networks, instant communications, information networking, and optical imaging are mentioned. rising fabrics that may take method functionality past normal CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. three-d (3-D) CMOS integration and co-integration with sensor know-how are defined to boot. The e-book is a needs to for an individual fascinated by circuit layout for destiny applied sciences.
The publication is written by means of firstclass foreign specialists in and academia. The meant viewers is training engineers with built-in circuit historical past. The ebook could be extensively utilized as a prompt studying and supplementary fabric in graduate path curriculum. meant viewers is pros operating within the built-in circuit layout box. Their task titles will be : layout engineer, product supervisor, advertising and marketing supervisor, layout staff chief, and so on. The e-book could be extensively utilized via graduate scholars. a number of the bankruptcy authors are collage Professors.Content:
Chapter 1 layout within the Energy–Delay house (pages 1–39): Massimo Alioto, Elio Consoli and Gaetano Palumbo
Chapter 2 Subthreshold Source?Coupled good judgment (pages 41–56): Armin Tajalli and Yusuf Leblebici
Chapter three Ultralow?Voltage layout of Nanometer CMOS Circuits for clever Energy?Autonomous platforms (pages 57–83): David Bol
Chapter four Impairment?Aware Analog Circuit layout via Reconfiguring suggestions structures (pages 85–101): Ping?Ying Wang
Chapter five Rom?Based common sense layout: A Low?Power layout standpoint (pages 103–118): Bipul C. Paul
Chapter 6 strength administration: permitting know-how (pages 119–145): Lou Hutter and Felicia James
Chapter 7 Ultralow strength administration Circuit for optimum power Harvesting in instant physique region community (pages 147–173): Yen Kheng Tan, Yuanjin Zheng and Huey Chian Foong
Chapter eight Analog Circuit layout for SOI (pages 175–205): Andrew Marshall
Chapter nine Frequency iteration and regulate with Self?Referenced CMOS Oscillators (pages 207–238): Michael S. McCorquodale, Nathaniel Gaskin and Vidyabhusan Gupta
Chapter 10 Synthesis of Static and Dynamic Translinear Circuits (pages 239–276): Bradley A. Minch
Chapter eleven Microwatt strength CMOS Analog Circuit Designs: Ultralow strength LSIS for Power?Aware functions (pages 277–312): Ken Ueno and Tetsuya Hirose
Chapter 12 High?Speed Current?Mode information Drivers for Amoled screens (pages 313–334): Yong?Joon Jeon and Gyu?Hyeong Cho
Chapter thirteen RF Transceivers for instant purposes (pages 335–351): Alireza Zolfaghari, Hooman Darabi and Henrik Jensen
Chapter 14 Technology?Aware conversation structure layout for Parallel systems (pages 353–392): Davide Bertozzi, Alessandro Strano, Daniele Ludovici and Francisco Gilabert
Chapter 15 layout and Optimization of built-in Transmission strains on Scaled CMOS applied sciences (pages 393–414): Federico Vecchi, Matteo Repossi, Wissam Eyssa, Paolo Arcioni and Francesco Svelto
Chapter sixteen On?Chip browsing Interconnect (pages 415–437): Suwen Yang and Mark Greenstreet
Chapter 17 On?Chip Spiral Inductors with built-in Magnetic fabrics (pages 439–462): Wei Xu, Saurabh Sinha, Hao Wu, Tawab Dastagir, Yu Cao and Hongbin Yu
Chapter 18 Reliability of Nanoelectronic VLSI (pages 463–481): Milos Stanisavljevic, Alexandre Schmid and Yusuf Leblebici
Chapter 19 Temperature tracking concerns in Nanometer CMOS built-in Circuits (pages 483–507): Pablo Ituero and Marisa Lopez?Vallejo
Chapter 20 Low?Power trying out for Low?Power LSI Circuits (pages 509–528): Xiaoqing Wen and Yervant Zorian
Chapter 21 Checkers for on-line Self?Testing of Analog Circuits (pages 529–555): Haralampos?G. Stratigopoulos and Yiorgos Makris
Chapter 22 layout and attempt of sturdy CMOS RF and MM?Wave Radios (pages 557–580): Sleiman Bou?Sleiman and Mohammed Ismail
Chapter 23 Contactless trying out and prognosis recommendations (pages 581–597): Selahattin Sayil
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Extra info for Advanced Circuits for Emerging Technologies
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Logical Effort designs are featured by an inﬁnite energy-to-delay sensitivity with respect to the sizes of internal transistors (since delay cannot be further reduced given a ﬁxed CIN ), but not with respect to the size of transistors deﬁning CIN . 50) is not satisﬁed for Logical Effort designs, which thus are not energy-efﬁcient . Only when CIN approaches inﬁnity, the Logical Effort design will be featured by an equal (and inﬁnite) energy-to-delay sensitivity with respect to all the tuning variables.
Advanced Circuits for Emerging Technologies by Krzysztof Iniewski